Iterative reconstruction with ZEISS OptiRecon
The new module for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes (XRM) will allow users to acquire high quality images in one-quarter the time: ZEISS OptiRecon uses a new, advanced iterative reconstruction technique. Now you can make the optimal choice for your requirements: same quality images four times faster, or superior quality in the same amount of time as standard image acquisition.
Compared to other iterative reconstruction offerings, ZEISS OptiRecon is
- Faster
- More-efficient
- More user-friendly
ZEISS OptiRecon is fast, efficient and user-friendly with a workflow-based user interface.
Other implementations require a complex cluster configuration to meet the computational demands of iterative reconstruction, and require extensive user expertise. ZEISS OptiRecon, a hardware/software module built on a single advanced workstation, offers a combination of a workflow-based user interface that doesn’t require knowledge of tomographic reconstruction algorithms, and an efficient proprietary implementation that allows reconstruction of a typical dataset in about three minutes.
This technology opens the door to 3D X-ray imaging, or computed tomography, to both a wider range of geological industry applications as well as the examination of in situ processes occurring at previously inaccessible timescales.
Iterative (left) and filtered back projection (right) reconstruction of a mining sample from 400 projections.
The new paper Optimisation of image quality and acquisition time for lab-based X-ray microtomography using an iterative reconstruction algorithm (open access here), co-authored by the Department of Earth Science & Engineering at Imperial College London and a team at ZEISS Microscopy, finds that ZEISS OptiRecon has proven to be especially effective for “sparse” samples where features are large relative to voxel size. According to Dr. Branko Bijeljic, one of the co-authors, “Iterative reconstruction is a key new technology for improving our work in high resolution X-ray microscopy. It will allow us to address in situ processes occurring at considerably shorter time scales without sacrificing image quality or data segmentability.” While particularly optimized for typical geological samples, ZEISS OptiRecon also has potential applications in other areas.
ZEISS OptiRecon is the most recent step ZEISS has taken to develop the ZEISS Xradia Versa system, introduced in 2010, with both hardware and software advancements to meet and exceed our users’ needs. As always, the system is available to existing users as a field upgrade, or can be purchased as an additional capability for ZEISS Xradia 510/520 Versa 3D X-ray microscopes.