New Advanced DualBeam Scanning Electron Microscope Designed to Increase Productivity and Accelerate Yield
New Advanced DualBeam Scanning Electron Microscope Designed to Increase Productivity and Accelerate Yield Thermo Scientific Helios 5 DualBeam microscope simplifies semiconductor analysis applications SHANGHAI, March 20, 2019 /PRNewswire/ — Today at Semicon China 2019, Thermo Fisher Scientific unveiled its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization... Read more