June 26, 2006 Microscopy

JEOL Installs Two Transmission Electron Microscopes in Nation’s First Biocontainment Laboratory for the Study of Live Viruses

Peabody, Mass., June 26, 2006 — JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron... Read more

May 19, 2006 Microscopy Product Launch

JEOL Introduces New High Resolution Direct Write System

Peabody, Mass., May 19, 2006 — JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of... Read more

May 19, 2006 Microscopy

Full Circumference Wafer Edge Review SEM at Semicon West 2006

Peabody, Mass., May 19, 2006 —  JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review... Read more

May 17, 2006 Microscopy

JEOL Introduces Ultrahigh Resolution Field Emission SEM for Nanotechnology

Peabody, Mass., May 17, 2006 —  JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in... Read more

April 17, 2006 Microscopy

Untethered TEM

Peabody, Mass., April 17, 2006 —  JEOL USA recently demonstrated a revolutionary remote capability for operating a transmission electron microscope (TEM) using a laptop computer with a cellular network connection. While seated at a picnic table 300 miles away, JEOL applications specialists manned the controls of a JEM-2200FS TEM operated at Lehigh University in Pennsylvania.... Read more

February 14, 2006 Microscopy Product Launch

JEOL Introduces New Series of Scanning Electron Microscopes

Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images... Read more