November 9, 2006 (Peabody, Mass.) — JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be... Read more
Peabody, Mass., July 25, 2006 — JEOL USA, the industry-leading supplier of electron microscopes, has installed a model JEM-2100 LaB6 Transmission Electron Microscope (TEM) at Oklahoma State University’s new microscopy service laboratory. The lab, which will serve researchers from both the university and neighboring industry, hosted an open house to introduce their expanded facilities and... Read more
Peabody, Mass., June 26, 2006 — JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron... Read more
Peabody, Mass., May 19, 2006 — JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of... Read more
Peabody, Mass., May 19, 2006 — JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review... Read more
Peabody, Mass., May 17, 2006 — JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in... Read more
Peabody, Mass., April 17, 2006 — JEOL USA recently demonstrated a revolutionary remote capability for operating a transmission electron microscope (TEM) using a laptop computer with a cellular network connection. While seated at a picnic table 300 miles away, JEOL applications specialists manned the controls of a JEM-2200FS TEM operated at Lehigh University in Pennsylvania.... Read more
Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images... Read more
Peabody, Mass., September 30, 2005 – JEOL, the industry-leading manufacturer of Transmission Electron Microscopes (TEMs), has developed a new capability known as Sirius which allows remote operation and imaging using the JEOL TEM. “Now you can see atoms from six thousand miles away,” says Dr. Mike Kersker, JEOL USA Vice President and Product Manager. “You... Read more
Peabody, Mass., June 16, 2005 – JEOL will present a suite of solutions for critical analysis of wafer defects and nanometric designs at Semicon West 2005. From precision sample preparation to ultrahigh resolution imaging at the nanoscale, JEOL semiconductor tools are designed for today’s most advanced processes. Cross Section Polisher Sample Preparation On display in... Read more