February 19, 2010 Acad, Gov/Utilities Microscopy

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

February 18, 2010 (Peabody, Mass.) — The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information... Read more

December 20, 2009 Microscopy Product Launch

Advanced Correlative Light/Electron Microscopy: Current Methods and New Developments Using Tokuyasu Cryosections

Microscopy is an essential tool for analysis of cellular structures and function. With the advent of new fluorescent probes and super-resolution light microscopy techniques, the study of dynamic processes in living cells has been greatly facilitated. Fluorescence light microscopy provides analytical, quantitative, and three-dimensional (3D) data with emphasis on analysis of live cells using fluorescent... Read more

December 16, 2009 Acad, Gov/Utilities Atomic Spectroscopy Microscopy Product Launch

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso

December 16, 2009 (Peabody, Mass.) — The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an... Read more

October 23, 2009 Microscopy Product Launch

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere

October 21, 2009, Peabody, Mass. — JEOL, a global leader in the development and manufacture of scanning and transmission electron microscopes, introduces ClairScope™, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM). The new JEOL ClairScope enables uncompromised observation of samples in their... Read more

September 10, 2009 Acad, Gov/Utilities Microscopy

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University

With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new... Read more

August 11, 2009 Microscopy

Download SEM Theory and Operation Books from JEOL Website

August 11, 2009 (Peabody, Mass.) — JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis. These two new books can be downloaded from the JEOL... Read more

July 1, 2009 Microscopy Product Launch

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009

June 30, 2009 (Peabody, Mass.) — JEOL, a leading supplier of electron microscopes for ultrahigh resolution imaging and analysis, will demonstrate its new ultrahigh resolution, analytical Thermal Field Emission Scanning Electron Microscope (SEM), the JSM-7600F, via live remote viewing and control from Semicon West, San Francisco, July 14-16. The SEM will be remotely operated from... Read more

March 10, 2009 Microscopy Product Launch

JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)

Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope.... Read more

March 9, 2009 Acad, Gov/Utilities Microscopy

JEOL USA and the College of Microscopy Increase Collaborative Efforts to Improve Microscopy Education

PITTCON, Chicago, Ill.—JEOL USA, renowned for its expertise as a leading supplier of electron microscopes for research and industrial problem solving, and the College of Microscopy, the education division of The McCrone Group, are proud to announce an increased partnership and joint commitment to improving the study of microscopy. JEOL USA will provide a new... Read more