MELVILLE, N.Y., June 15, 2016 (GLOBE NEWSWIRE) — Nikon Instruments Inc. kicks off the judging for the 2016 Nikon Small World Photomicrography and Small World in Motion Video Competitions today. While this year’s judges all have a strong background in science, each brings a unique perspective and expertise to the judging table: two of the... Read more
The award-winning WITec RISE microscopy mode for correlative Raman-SEM imaging is now compatible with the scanning electron microscope ZEISS MERLIN. The new hybrid system was jointly developed by the two German microscope manufacturers, bringing together a wealth of expertise in Raman spectroscopic imaging and advanced ultrastructural analysis. Customers benefit from both high-quality and sophisticated system... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016 Atlanta, GA) — JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com Scientists from the Institute of Microbiology and Immunology and the Institute of Pathology in Ljubljana, Slovenia are the first in the world to publish and prove that the ZIKA virus is associated with Microcephaly (New England Journal of Medicine, February 10, 2016). ZIKV was found... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (February 3, 2016 — Peabody, MA) — JEOL’s most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or “F2,” the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon... Read more
(February 3, 2016 — Peabody, MA) — JEOL’s most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or “F2,” the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. “The combined boost in probe current from the... Read more
(January 14, 2016 — Peabody, MA) — JEOL USA selected two Grand Prize winners from a large collection of customer images submitted to the 2015 Image Contest throughout the calendar year. While one image was selected to win each month, the Grand Prize images exhibited the very best composition and resolution, and demonstrated excellent technical... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (January 14, 2016 — Peabody, MA) — JEOL USA selected two Grand Prize winners from a large collection of customer images submitted to the 2015 Image Contest throughout the calendar year. While one image was selected to win each month, the Grand Prize images exhibited... Read more
MELVILLE, N.Y., Dec. 14, 2015 (GLOBE NEWSWIRE) — Nikon Instruments Inc. today released two new inverted microscope ECLIPSE models for routine laboratory work and basic research. Featuring enhanced functionality, improved workflow, a newly developed emboss contrast technique and a compact design, the new Research Microscope ECLIPSE Ts2R and Routine Microscope ECLIPSE Ts2 set a new... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com Portland, OR – November 4, 2015 — JEOL’s new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.... Read more