August 22, 2017 Lab Top-10 Microscopy Product Launch

Bruker and DECTRIS Announce Advances in D8™ X-ray Diffraction Systems with the New EIGER2 R 500K Detector

HYDERABAD, India, Aug. 22, 2017 /PRNewswire/ — At the 24th Congress and General Assembly of the International Union of Crystallography (IUCr), Bruker and DECTRIS today announce the EIGER2 R 500K, the latest generation of Hybrid Photon Counting (HPC) pixel detectors developed by DECTRIS, the technology leader for HPC detectors for laboratory instrumentation and synchrotron beam lines.... Read more

August 21, 2017 Microscopy PR/Corporate

Consolidated Financial Statement for the First Quarter Ended June 30, 2017

1Q Results, June 30, 2017（PDF）    This article is translated from press release in Japanese for your convenience. Forward-Looking StatementsStatements in this news release, other than those based on historical fact, concerning the current plans, prospects, strategies and expectations of the Company and its Group represent forecasts of future results. While such statements are based... Read more

August 9, 2017 Lab Top-10 Microscopy

LabSolutions Analytical Data System Updated with Stronger Data Integrity for Spectrophotometers

Pharmaceutical quality must be tested properly using pre-specified procedures, and the analytical data and test results obtained must be managed appropriately in accordance with good manufacturing practices (GMP), as specified in the Japanese Ministry of Health, Labour and Welfare Ordinance on Standards for Manufacturing Control and Quality Control for Drugs and Quasi-drugs. Furthermore, the United... Read more

August 8, 2017 Lab Top-10 Microscopy Product Launch

Bruker Introduces Software Package for Layer Analysis with XTrace Micro-XRF on Electron Microscopes

ST. LOUIS, Missouri – August 7, 2017 – At the Microscopy & Microanalysis 2017 Meeting Bruker today presents XMethod, the world’s first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus X-ray source for scanning electron microscopes (SEM). The software enables... Read more

August 8, 2017 Microscopy Product Launch

Oxford Instruments enables Real-time Chemical Imaging by EDS

07 August 2017 Oxford Instruments, a global leader in microanalysis systems, has introduced a real-time navigation and imaging system for the SEM that helps users interactively explore their sample based on video-rate X-ray maps coloured by element rather than just the black and white electron image alone.  Unlike traditional static approaches to elemental analysis that... Read more

August 8, 2017 Lab Top-10 Microscopy Product Launch

Thermo Fisher Scientific Advances Cryo-EM Leadership to Drive Structural Biology Discoveries

New Thermo Scientific Krios G3i raises bar for performance, automation and time-to-results Breakthrough Thermo Scientific Glacios provides a cryo-EM entry path for a broader range of researchers ST. LOUIS, Aug. 7, 2017 /PRNewswire/ — Microscopy & Microanalysis 2017 — Thermo Fisher Scientific, the world leader in serving science, has extended its leadership in cryo-electron microscopy (cryo-EM) with the introduction of... Read more

August 7, 2017 Lab Top-10 Microscopy Product Launch

Industry’s First Dedicated Cryo-DualBeam System Automates Preparation of Frozen, Biological Samples

New Thermo Scientific Aquilos FIB/SEM protects sample integrity and enhances productivity for cryo-electron tomography workflow ST. LOUIS, Aug. 7, 2017 /PRNewswire/ — Microscopy & Microanalysis 2017 – The new Thermo Scientific Aquilos is the first commercial cryo-DualBeam (focused ion beam/scanning electron microscope) system dedicated to the preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a... Read more

August 7, 2017 Lab Top-10 Microscopy Product Launch

New Quattro Field Emission ESEM Emphasizes Versatility and Ease of Use

Thermo Scientific Quattro ESEM allows materials science researchers to study nanoscale structure in almost any material under a range of environmental conditions ST. LOUIS, Aug. 7, 2017 /PRNewswire/ — Microscopy & Microanalysis 2017 — The ability of scientists to study samples at the nanometer scale and in natural conditions and environments is critical to the discovery and development of... Read more

August 7, 2017 Microscopy Product Launch

JEOL Introduces new IT500HR High Resolution SEM on opening day at M&M 2017

For further information, please visit https://www.jeol.co.jp/en/products/detail/JSM-IT500HR.html. # # # JEOL USA, Inc. JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection... Read more