Andor adds Dragonfly 200 to its highly successful high-speed confocal imaging platform

09 November 2017 Additional flexibility, lightning speed and superior image quality at a price-point comparable to traditional point scanning confocal Belfast, Northern Ireland, 9th November 2017 – Andor, an Oxford Instruments company, is pleased to announce the launch of Dragonfly 200, the latest model of its innovative high-speed confocal imaging platform. Dragonfly integrates Andor’s industry-leading... Read more

Shimadzu's New Metal Artifact Reduction Software Enables Acquisition of Clear Images of Composite Parts with a Microfocus X-Ray CT System

Shimadzu has released its Metal Artifact Reduction Software. Intended for the Shimadzu inspeXio SMX-225CT FPD HR Microfocus X-ray CT system, this software significantly reduces artifacts occurring in CT images, enabling the acquisition of clear images.A microfocus X-ray CT system is used to observe the internal structure of an object targeted for observation in 3D. It... Read more

Photometrics Sets a New Standard in Scientific Imaging with Prime BSI™ CMOS Camera

NOVEMBER 7, 2017 Camera Offers Near Perfect 95 Percent Quantum Efficiency with an Optimized Pixel Size for High Resolution Live Cell Microscopy Tucson, Ariz. — Setting a new standard in scientific imaging, Photometrics; announces the release of its Prime BSI Scientific CMOS camera, a new addition to its Prime family of imaging products. Prime BSI provides a perfect... Read more

ZEISS Strengthens Sales and Service in Russia, Ukraine, CIS Countries and Georgia through Acquisition of Majority Stake in Optec Group

OBERKOCHEN/Germany, MOSCOW/Russia, 2017-11-03. ZEISS will strengthen its activities in Russia, the Ukraine, the Commonwealth of Independent States (CIS) and Georgia by acquiring a majority stake in the Optec Group, – the long-standing sales and service partner responsible for this territory. With this step, ZEISS is continuing and expanding its almost 115-year presence in the region.... Read more

New generation of ZEISS EVO scanning electron microscope introduced

Modular platform for intuitive operation, routine investigations and research applications JENA/Germany, 2017-11-02. ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of... Read more

Park Systems Announces the Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute

Dr. Bahgat G. Sammakia, Interim President of the SUNY Polytechnic Institute, the world’s most advanced, university-driven research enterprise and home of Park Systems new NanoScience Center  SUNY Poly is thrilled that a worldwide leader in Atomic Force Microscopy is selecting the campus for its newest location, and we warmly welcome Park Systems as we look... Read more

ZEISS Crossbeam 550 receives German Design Award 2018

JENA/Germany, 2017-10-26. A jury of experts from the German Design Council has voted the ZEISS Crossbeam 550 focused ion beam scanning electron microscope (FIB-SEM) as a winner of the German Design Award 2018 in the “Material and Surfaces” category. High-end applications in research and industry Users of this FIB-SEM investigate nanostructures such as composites, metals,... Read more

Release of Crossover Cath Lab System, Trinias unity edition Intervention Support with Real Time Image Processing Technology Covering Wide Range of Clinical Usage from Cardiac to Peripheral Region

Cath lab system is X-ray imaging system which is used under interventional treatment to treat patients with angina or cardiac infarct by using cathether. Intervention, which is less invasive treatment compared to surgery operation, recently attracts more attention, and more rapid development has been seen with downsizing and device qualification, reduction of contrast media, and... Read more

Free webinar: Mechanical pre-preparation and ion milling for SEM observation – the right combination to hit your target

During the first part of this webinar, Dr. Wolfgang Grünewald, application specialist at Leica Microsystems, will demonstrate how the unique combination of pre-preparation system and ion milling system makes fast site specific sample preparation for Scanning Electron Microscopy or optical microscopy possible. You will discover how keeping the sample in the same holder and observing... Read more

ZEISS introduces newest release of LabDCT diffraction contrast tomography platform for analytical 3D materials imaging Advanced analytical module for tomography in the laboratory provides 3D grain imaging

JENA/Germany, PLEASANTON/California/USA , 2017-10-23. ZEISS is extending the boundaries of non-destructive 3D X-ray imaging with the newest release of its diffraction contrast tomography platform, LabDCT. LabDCT provides large volume 3D maps of grains, the fundamental building blocks of metal alloys and other polycrystalline materials. Materials researchers can now combine 3D crystallographic grain imaging with the... Read more