New field emission scanning electron microscope ZEISS GeminiSEM 450 introduced
Addressing the highest demands in imaging and analytics from any sample JENA/Germany, 2017-12-04. ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. With ZEISS GeminiSEM 450, users benefit from high resolution, surface sensitive... Read more