Bruker Introduces Contour LS-K 3D Optical Profiler

LightSpeed Focus Variation Technology Provides Fast, Extremely Accurate Metrology STUTTGART, Germany, April 24, 2018 /PRNewswire/ — At the 32nd Control 2018 international trade fair for quality assurance, Bruker today announced the release of its new Contour LS-K3D optical profiler with LightSpeed™ focus variation technology. This technique uses optimized focusing with advanced algorithms to construct 3D surface... Read more

ZEISS invites to Day of Microscopy in Oberkochen, Germany

Focus on the latest microscopy techniques and a wide range of applications News ZEISS will host the Day of Microscopy at the ZEISS Forum and ZEISS Microscopy Customer Centre Europe in Oberkochen on May 16 and 17, 2018. International guests from research, science and industry can expect a varied program of lectures, workshops and discussions... Read more

ZEISS invites to Day of Microscopy in Oberkochen, Germany

Focus on the latest microscopy techniques and a wide range of applications News ZEISS will host the Day of Microscopy at the ZEISS Forum and ZEISS Microscopy Customer Centre Europe in Oberkochen on May 16 and 17, 2018. International guests from research, science and industry can expect a varied program of lectures, workshops and discussions... Read more

Successful light sheet microscopy workshop in Geneva

The Wyss Center welcomed more than 100 participants Events News In March, the Wyss Center in Geneva was the site of ZEISS’ first joint workshop on the topic of light sheet fluorescence microscopy (LSFM). The aim of the workshop was to provide information on the different aspects of LSFM through various talks and encourage developers... Read more

Successful light sheet microscopy workshop in Geneva

The Wyss Center welcomed more than 100 participants Events News In March, the Wyss Center in Geneva was the site of ZEISS’ first joint workshop on the topic of light sheet fluorescence microscopy (LSFM). The aim of the workshop was to provide information on the different aspects of LSFM through various talks and encourage developers... Read more

Grand Opening of UC Irvine Materials Research Institute (IMRI) to Spotlight JEOL Center for Nanoscale Solutions

GRAND ARM Transmission Electron Microscope – JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI) April 18, 2017 – Peabody, Mass. —- World-renowned electron microscopists will join Dr. Xiaoqing Pan, Director of the University of California Irvine Materials Research Institute (IMRI), for the Grand Opening of the JEOL Center for Nanoscale Solutions and... Read more

Park Systems, World-Leading Manufacturer of Atomic Force Microscopes Expands with a New Subsidiary in Mexico

SANTA CLARA, California, April 11, 2018 Park Systems world-leading manufacturer of Atomic Force Microscopes (AFM), announced the opening of their subsidiary in Mexico, Park Systems Microscopy SA de CV, to better serve the nanotechnology markets in Mexico and Latin America. The new office is located in Reforma Latino Paseo de la Reforma, 296 Col Juarez Ciudad... Read more

Thermo Scientific Krios G3i Cryo-Electron Microscope Wins Gold Edison Award

Krios G3i helps scientists better understand disease mechanisms in order to accelerate cures HILLSBORO, Ore., April 12, 2018 /PRNewswire/ — Thermo Fisher Scientific, the world leader in serving science, today announced the Thermo Scientific Krios G3i cryo-electron microscope (cryo-EM) received a 2018 Edison Awards gold medal. The Edison Awards, named after Thomas Alva Edison, recognize... Read more

ZEISS expands X-ray imaging portfolio with ZEISS Xradia Context microCT

Built on renowned ZEISS Xradia platform and field-convertible to ZEISS Xradia Versa X-ray microscope JENA/Germany, 2018-04-11. ZEISS today introduces a new X-ray imaging instrument, ZEISS Xradia Context microCT, a large field-of-view, non-destructive 3D X-ray microcomputed tomography system. ZEISS Xradia Context is built on time-tested ZEISS Xradia technology, reaping crossover benefits of years of platform advancements... Read more