Consolidated Financial Statements for the First Quarter Ended June 30, 2018 FY2019(April 1, 2018-March 31, 2019)[UNAUDITED]

This article is translated from press release in Japanese for your convenience. Forward-Looking Statements Statements in this news release, other than those based on historical fact, concerning the current plans, prospects, strategies and expectations of the Company and its Group represent forecasts of future results. While such statements are based on the conclusions of management... Read more

Hitachi High-Technologies Launches the SU7000: A Transformative Schottky Field Emission Scanning Electron Microscope

(PDF format, 268kBytes) — High Throughput, Large Chamber, Enhanced Versatility — Tokyo, Japan, July 31, 2018—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with simultaneous acquisition as well as... Read more

Andor Launches Sona for Fluorescence Microscopy

24 Jul The World’s Most Sensitive Back-illuminated sCMOS Camera Platform Andor Technology (Andor), an Oxford Instruments company and world leader in scientific imaging and spectroscopy solutions, today announced the launch of the new ultrasensitive Sona back-illuminated camera platform for fluorescence microscopy. Featuring 95% Quantum Efficiency and market-leading vacuum cooling down to         -45 °C, Sona represents the... Read more

New Asylum Research AFM Accessory Enables Advanced Magnetics ResearchUnder Both In-Plane and Out-of-Plane Applied Magnetic Fields

24 Jul Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements. The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale... Read more

“I’m working on something that could, one day, help cure my disease”

Researching Alport syndrome with ZEISS multibeam ion microscopy Customer Story Knowledge A ZEISS team in Peabody, USA is hard at work developing the multibeam ion microscope ZEISS ORION NanoFab. This instrument makes it possible to uncover kidney diseases that previously remained a mystery – a technique that can save lives. Technology connects Two colleagues from... Read more

Introducing the Ultim® Max range: a new suite of high performance SEM-EDS detectors

17 Jul Oxford Instruments, the global leader in microanalysis systems, is proud to announce the most comprehensive range to date of Silicon Drift Detectors (SDD) for Energy Dispersive (EDS) analysis in the Scanning Electron Microscope.  New Ultim® Max 65mm2 and 40mm2 models have been released, to complete the Ultim range and join the 170mm2, 100mm2, and the unique... Read more

A successful partnership is strengthened

16 July 2018 The Bordeaux Imaging Center (BIC) and Leica Microsystems are now working together on an official basis For 10 years the Bordeaux Imaging Center (BIC), part of the Neuroscience Institute of Bordeaux, and Leica Microsystems have enjoyed a successful partnership and strong relationship. As an expression of appreciation and will to further expand it,... Read more

Park Systems AFM Scholarship Awards – Nasim Bosh and Florina Serdean

TWO NEW PARK AFM SCHOLARSHIP WINNERS FROM EUROPE ANNOUNCED!   Mannheim, 13 July, 2018 Park Systems, the world’s leading manufacturer of atomic force microscopes (AFM) is proud to award the Park Systems AFM Scholarships to two new young scientists from Europe: 1st Prize goes to Nasim Bosh from HFU Furtwangen, Campus Tuttlingen, Germany 2nd Prize goes to Florina Serdean from Technical University... Read more