Announcing the handover of EDS systems sales & maintenance and the completion of the OEM contract with HORIBA, Ltd.

1st August 2018 Oxford Instruments NanoAnalysis, the global leader in microanalysis systems, today announces the termination of its long standing partnership with HORIBA, Ltd for the distribution of EDS systems sales and maintenance work under the EMAX brand in Japan and Asia, and the handover of all activity from Horiba to Oxford Instruments directly. Oxford... Read more

Announcing Transfer of EMAX Series Sales and Maintenance Service Operations

August 1, 2018 July 31, 2018 To Our Valued Customers HORIBA, Ltd. Oxford Instruments Nano Analysis Announcing Transfer of EMAX Series Sales and Maintenance Service Operations Greetings, and we trust that this communication finds your company enjoying strong and prosperous business conditions. Upon this occasion, we wish to convey our most profound gratitude for your... Read more

Consolidated Financial Statements for the First Quarter Ended June 30, 2018 FY2019(April 1, 2018-March 31, 2019)[UNAUDITED]

This article is translated from press release in Japanese for your convenience. Forward-Looking Statements Statements in this news release, other than those based on historical fact, concerning the current plans, prospects, strategies and expectations of the Company and its Group represent forecasts of future results. While such statements are based on the conclusions of management... Read more

Hitachi High-Technologies Launches the SU7000: A Transformative Schottky Field Emission Scanning Electron Microscope

(PDF format, 268kBytes) — High Throughput, Large Chamber, Enhanced Versatility — Tokyo, Japan, July 31, 2018—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with simultaneous acquisition as well as... Read more

Andor Launches Sona for Fluorescence Microscopy

24 Jul The World’s Most Sensitive Back-illuminated sCMOS Camera Platform Andor Technology (Andor), an Oxford Instruments company and world leader in scientific imaging and spectroscopy solutions, today announced the launch of the new ultrasensitive Sona back-illuminated camera platform for fluorescence microscopy. Featuring 95% Quantum Efficiency and market-leading vacuum cooling down to         -45 °C, Sona represents the... Read more

New Asylum Research AFM Accessory Enables Advanced Magnetics ResearchUnder Both In-Plane and Out-of-Plane Applied Magnetic Fields

24 Jul Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements. The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale... Read more

“I’m working on something that could, one day, help cure my disease”

Researching Alport syndrome with ZEISS multibeam ion microscopy Customer Story Knowledge A ZEISS team in Peabody, USA is hard at work developing the multibeam ion microscope ZEISS ORION NanoFab. This instrument makes it possible to uncover kidney diseases that previously remained a mystery – a technique that can save lives. Technology connects Two colleagues from... Read more

Introducing the Ultim® Max range: a new suite of high performance SEM-EDS detectors

17 Jul Oxford Instruments, the global leader in microanalysis systems, is proud to announce the most comprehensive range to date of Silicon Drift Detectors (SDD) for Energy Dispersive (EDS) analysis in the Scanning Electron Microscope.  New Ultim® Max 65mm2 and 40mm2 models have been released, to complete the Ultim range and join the 170mm2, 100mm2, and the unique... Read more