ZEISS to Present Initial Release of APEER, its Digital Microscopy Platform for Applications in Science and Industry

Experience the cloud-based platform at M&M in Baltimore, booth 624 JENA/Germany, BALTIMORE/USA, 2018-08-06. ZEISS presents the initial release of its cloud-based digital microscopy platform, known under the name APEER at the Microscopy & Microanalysis conference (M&M) in Baltimore, USA. Microscopy users will be able to automatically process images in the cloud by leveraging application workflows... Read more

Nikon Releases High-Speed Super Resolution Microscope

MELVILLE, N.Y., Aug. 06, 2018 (GLOBE NEWSWIRE) — Nikon Instruments Inc., innovator of advanced optical instruments, today announced the release of the latest in its line of state-of the art tools. The N-SIM S Super Resolution Microscope enables super-solution imaging of live cells at ten-times the speed of conventional SIM. Powered at its core by... Read more

Thermo Fisher Scientific Brings Benefits of FEG to New Desktop Scanning Electron Microscope u

Thermo Fisher Scientific Brings Benefits of FEG to New Desktop Scanning Electron Microscope The Phenom Pharos desktop scanning electron microscope delivers high-performance, high-resolution images to academic and industrial researchers BALTIMORE, Aug. 6, 2018 /PRNewswire/ — Microscopy and Microanalysis 2018 — The Thermo Scientific Phenom Pharos desktop scanning electron microscope (SEM) is the first desktop SEM solution from... Read more

Thermo Fisher Scientific Showcases New Electron Microscopy and Microanalysis Solutions at M&M 2018

Thermo Fisher Scientific Showcases New Electron Microscopy and Microanalysis Solutions at M&M 2018 Technology advancements broaden the portfolio for academic and industrial researchers working in materials and life sciences, leading them to a next wave of discovery BALTIMORE, Aug. 6, 2018 /PRNewswire/ — Microscopy and Microanalysis 2018 — Thermo Fisher Scientific, the world leader in serving science, today... Read more

New Electron Backscatter Diffraction (EBSD) Detector Features Advanced Sensors and Optics

New Electron Backscatter Diffraction (EBSD) Detector Features Advanced Sensors and Optics Thermo Scientific Lumis EBSD detector enables fast and accurate crystallographic analysis of SEM samples for material scientists and metallurgists BALTIMORE, Aug. 6, 2018 /PRNewswire/ — Microscopy and Microanalysis 2018  — A new electron backscatter diffraction (EBSD) detector for electron microscopy is designed to help... Read more

ZEISS to Present Initial Release of APEER, its Digital Microscopy Platform for Applications in Science and Industry

Experience the cloud-based platform at M&M in Baltimore, booth 624 JENA/Germany, BALTIMORE/USA, 2018-08-06. ZEISS presents the initial release of its cloud-based digital microscopy platform, known under the name APEER at the Microscopy & Microanalysis conference (M&M) in Baltimore, USA. Microscopy users will be able to automatically process images in the cloud by leveraging application workflows... Read more

“I am impressed time and again by the many applications of microscopy”

Employee Moments Anita Sonnenfroh is heading the ZEISS sales and service company in Iberia, which brings together the Microscopy, Industrial Metrology and Medical Technology business groups. Her many experiences over the years and numerous extraordinary moments have caused her fascination for microscopy to grow. Read the interview here: Tags: Correlative Microscopy, Electron and Ion Microscopy,... Read more

The world’s fastest solution for high quality 3D tomography

03 August 2018 The ARTOS 3D ultramicrotome expands 3D image reconstruction applications for cell biology research Wetzlar, Germany. The new ARTOS 3D ultramicrotome is a powerful ARray TOmography Solution for 3D imaging applications from Leica Microsystems. It marks a new level of quality and speed for ultramicrotome sectioning intended for 3D tomography with a light... Read more

CAMECA Launches First Electron Probe Microanalyzer with Touch-Screen Interface

Friday, August 3, 2018 JOIN THE CONVERSATION GENNEVILLIERS, France – CAMECA, a world leader in scientific instrumentation and metrology solutions, is pleased to announce the launch of SXFive-TACTIS, the newest addition to the CAMECA line of high-end microanalytical instruments, and the only Electron Probe Microanalyzer (EPMA) in the world with a touch-screen interface. “We are very proud... Read more