Bruker Launches New Dimension XR Family of Scanning Probe Microscopes
Featuring Major Advances in AFM Technology for Nanoscale Quantification SANTA BARBARA, California – November 28, 2018 – Bruker today announced the release of the Dimension XR™ family of scanning probe microscopes (SPMs). These new systems incorporate major AFM innovations, including Bruker’s proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which for... Read more