EDAX Adds a New Detector to the Elite T EDS Analysis System for TEM
Friday, June 7, 2019 MAHWAH, NJ, June 5, 2019 – AMETEK EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has added a new 160 mm2 detector to its Elite T Energy Dispersive Spectroscopy (EDS) System for Transmission Electron Microscopes (TEM). The Elite T EDS System utilizes fast Silicon Drift Detectors, now with 70 mm2 and... Read more