New Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM
August 1, 2022 (M&M 2022 Portland, Oregon) JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect... Read more
World’s Fastest Q-TOF Mass Spectrometer Capable of Simultaneously Measuring Positive and Negative Ions Release of LCMS-9050 High-Performance Liquid Chromatograph Mass Spectrometer
World’s Fastest Q-TOF Mass Spectrometer Capable of Simultaneously Measuring Positive and Negative Ions Release of LCMS-9050 High-Performance Liquid Chromatograph Mass Spectrometer Read more