Peabody, Mass., March 9, 2006 — A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation.... Read more
Peabody, Mass., February 14, 2006 – Live demos of a new low vacuum, high resolution SEM, direct analysis in real time mass spectrometer (AccuTOF-DART™), and remote operation of ECA/ECX NMR spectroscopy systems will be ongoing in the JEOL booth, #2132 and 2133 at the Orange County Convention Center West Building, Orlando, Florida. SEM Technology Throughout... Read more
Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images... Read more
Peabody, Mass., February 9, 2006 – Since capturing the Editor’s Gold Award for best new product at Pittcon 2005, the DART™ direct analysis ion source has found some unusual applications that, prior to this new technology, would have been virtually impossible. For example, fingerprints contain a great deal of chemical information that is not often... Read more
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