July 24, 2007 Mass Spectrometry

Third Edition of Mass Spec Applications Booklet for Direct Analysis in Real Time (DART®)

June 25, 2007 (Peabody, Mass.) — JEOL USA has recently published the third edition of its popular AccuTOF-DART Direct Analysis in Real Time mass spectrometry applications notebook. The updated booklet contains new data on chemical reaction monitoring and detection of the peroxide explosives TATP and HMTD. A compilation of 28 applications notes describes analyses performed... Read more

July 11, 2007 Acad, Gov/Utilities Microscopy

JEOL Aims Direct-Write E-Beam System at Academics

JEOL USA (Peabody, Mass.) today announced a direct-write e-beam lithography system targeted at research labs and universities. The JBX-5500FS system is capable of 10 nm resolution at 50 kV on silicon pieces or wafers up to 100 mm. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/81/JEOL-Aims-Direct-Write-E-Beam-System-at-Academics Read more

July 9, 2007 Microscopy

In-situ JEOL TEM Reveals Distinctive Information at DOE Lawrence Berkeley National Lab

A team of researchers from the Department of Energy’s Lawrence Berkeley National Laboratory, Purdue University and Hysitron Inc. in Minneapolis are using special instrumentation with the JEOL 3010 in situ transmission electron microscope to correlate high-resolution load-displacement measurements with individual video frames, showing how nanoscale volumes of aluminum deform under stress from a diamond “nanoindenter”.... Read more