The World’s First Circular Dichroism Detector for Ultra High Pressure Liquid Chromatography Chiral separation has become one of the most important application areas in HPLC, including the use of ultra-high pressure HPLC (X-LC®). The increasing demand for chiral chromatography in various fields, such as drug analysis, drug discovery, biochemical analysis, natural product analysis, organic synthesis,... Read more
This year JASCO celebrates its 50th anniversary in the analytical instrumentation market. The company was founded in 1958 by a group of researchers at the Institute of Optics, at what is now Tsukuba University, who required an infrared spectrophotometer for their research. Since a commercially available instrument did not exist in Japan, they undertook the... Read more
November 27, 2007, Peabody, Mass. — JEOL USA introduces a new high throughput SEM/FIB that combines Focused Ion Beam micro milling with the high resolution imaging of the JEOL LaB6 electron column. The MultiBeam is a high-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair. A versatile all-in-one... Read more
November 5, 2007 (Peabody, Mass.) — JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university’s Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL... Read more
One of the world’s leading electron microscopes at Oak Ridge National Laboratory, the JEOL 2200FS Aberration Corrected Electron Microscope (ACEM), is controlled and manipulated from London via the Lambda Rail. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/85/Cross-Atlantic-Operation-of-JEOL-2200FS-Aberration-Corrected-Electron-Microscope Read more