January 22, 2010 Mass Spectrometry Product Launch

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance

January 21, 2010, Peabody, Mass. — JEOL’s award-winning AccuTOF-DART™ mass spectrometer, featuring the new iPod touch-enabled DART SVP ion source, offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology. JEOL introduced the Direct Analysis in Real Time (DART™) ion source in 2005 for its AccuTOF-LC mass... Read more

December 20, 2009 Microscopy Product Launch

Advanced Correlative Light/Electron Microscopy: Current Methods and New Developments Using Tokuyasu Cryosections

Microscopy is an essential tool for analysis of cellular structures and function. With the advent of new fluorescent probes and super-resolution light microscopy techniques, the study of dynamic processes in living cells has been greatly facilitated. Fluorescence light microscopy provides analytical, quantitative, and three-dimensional (3D) data with emphasis on analysis of live cells using fluorescent... Read more

December 16, 2009 Acad, Gov/Utilities Atomic Spectroscopy Microscopy Product Launch

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso

December 16, 2009 (Peabody, Mass.) — The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an... Read more

October 23, 2009 Microscopy Product Launch

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere

October 21, 2009, Peabody, Mass. — JEOL, a global leader in the development and manufacture of scanning and transmission electron microscopes, introduces ClairScope™, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM). The new JEOL ClairScope enables uncompromised observation of samples in their... Read more

September 10, 2009 Acad, Gov/Utilities Microscopy

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University

With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new... Read more