April 6, 2010, Peabody, Mass. — The imaging performance of today’s generation of Transmission Electron Microscopes (TEMs) is improved dramatically through the use of a novel technique, the thin film phase plate. JEOL is the only electron microscope supplier to offer commercially-available thin film phase plate technology to its Life Sciences customers, in particular those... Read more
Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima, who pioneered the use of high resolution transmission electron microscopy (HRTEM) to characterize nanomaterials in the early 70s and successfully imaged carbon nanotubes in the early 90s. Although he has used JEOL TEMs for the past four decades, Dr. Iijima visited JEOL... Read more
March 18, 2010, Peabody, Mass. — JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the... Read more
February 18, 2010 (Peabody, Mass.) — The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information... Read more
February 8, 2010, Peabody, Mass. — The installation of an advanced imaging tool, a JEOL Electron Probe Microanalyzer (EPMA), will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina. In January, JEOL completed the installation of its new generation of EPMA, also known as a microprobe, at the Southeastern North... Read more