July 20, 2010 (Peabody, Mass.) — JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its... Read more
July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M)... Read more
JASCO is pleased to announce the release of the NRS-5000/7000 series of Raman spectrometers. Building upon the powerful capabilities of the NRS-3000 series, the NRS-5000 and NRS-7000 series instruments provide even greater features and technological innovations. The NRS-5000/7000 series instruments can integrate as many as 8 excitation lasers (9 wavelengths) from the UV to the... Read more
May 24, 2010 (Peabody, MA) — Who says science isn’t fun? In their daily work, experienced microscopists at JEOL USA Inc. in Peabody, Massachusetts look at every kind of sample imaginable – paper, neurons in the brain, ceramics, semiconductors, insects, and forensic evidence, to name just a few – through the state-of-the-art scanning electron microscopes... Read more
May 21, 2010 (Peabody, Mass.) — JEOL USA announced today the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of... Read more