August 31, 2010 (Peabody, Mass.) — JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other... Read more
August 25, 2010 (Peabody, Mass.) — JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging... Read more
August 18, 2010 (Peabody, Mass.) — The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10... Read more
August 18, 2010 (Peabody, Mass.) — Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of... Read more
In pars plana vitrectomy, three ocular incisions are normally made. Thanks to the superb optics and the unique illumination concept of the Leica M844 F40, Dr. Luca Cappuccini from Reggio Emilia Hospital in Italy can operate without one of the incisions for certain vitreoretinal procedures. This shortens the duration of surgery and speeds up eye... Read more