October 20, 2011 (Peabody, Mass.) — JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody, has received the prestigious Anachem Award, given by the Association of Analytical Chemistry for his contributions to the development of organic mass spectrometry. The award was presented at the Federation of Analytical Chemical and Spectroscopy Societies (FACSS) meeting in... Read more
October 3, 2011 (Peabody, Mass.) — A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has... Read more
September 27, 2011 (Peabody, MA) — JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody, Massachusetts, has entered an agreement with Arquimed, Ltda. making Arquimed JEOL’s exclusive agent in Chile. Arquimed, located in Santiago, has a 75-year history as one... Read more
July 12, 2011 (Peabody, Mass.) — A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS);... Read more
July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more