June 19, 2012 – Boulder, CO – GE Analytical Instruments has just launched a new 3-minute video about its Sievers Certified Reference Materials (Total Organic Carbon, or TOC, Standards) and Certified <10 ppb TOC sample vials. This video shows how GE Analytical Instruments produces its Sievers Certified Reference Materials and Certified TOC Vials using the highest... Read more
May 31, 2012 (Peabody, Mass.) — JEOL’s new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution JSM-7800F. The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for nanotechnology imaging and analysis. JEOL’s highest performance FE-SEM makes it... Read more
May 1, 2012 – Boulder, CO – GE Analytical Instruments is pleased to announce the new Smart Leakwise Controller (SLC-220), a digital signal processor that interfaces with Leakwise ID-220 Oil-on-Water Monitoring Sensors to report hydrocarbons spill/leak alerts, including layer buildup and thickness. The SLC-220 enables communications via a wide variety of outputs and communication interfaces for... Read more
JASCO featured the new High-Throughput Circular Dichroism (CD) Measurement System during Pittcon 2012, Orlando, Florida. The JASCO high-throughput CD measurement (HDX-CD) system automates CD and UV/Visible Absorbance measurements for large numbers of samples. A third detection option also allows simultaneous Fluorescence measurement of the samples. An innovative flow system coupled with the ASU-800 autosampler offers... Read more
JASCO introduced the MSV-5300 UV-Vis/NIR Microscope, one microscope system of the MSV-5000 series, during Pittcon 2012, Orlando, Florida. This microscope system incorporates a double-beam scanning spectrophotometer for optimum measurements in the UV-Vis to NIR region (200-2700 nm). The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of... Read more