October 25, 2012 (Peabody, MA) — A new application note from JEOL demonstrates that high mass resolving power can be maintained for matrix-assisted laser desorption ionization (MALDI) imaging of biological specimens by using a TOF system with a very long flight path. The JEOL SpiralTOF MALDI TOF/TOF mass spectrometer has unique multi-turn ion optics that... Read more
August 24, 2012 – Boulder, CO – GE Analytical Instruments announces a new total organic carbon (TOC) technology trade-in program for pharmaceutical manufacturers shipping products to Japan. The program includes discounts and bonus options on Sievers TOC Analyzers, TOC standards, and validation documentation that help manufacturers comply with the new Japanese Pharmacopoeia (JP16) regulations going into effect September 20, 2012. Savings... Read more
August 3, 2012 (Peabody, Mass.) – JEOL’s newest AccuTOF GCv model – the “4G” – now offers even faster data acquisition rates and higher resolving power than its predecessor. The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a resolving power of 8000. The 50 Hz acquisition rate now makes... Read more
July 26, 2012 (Peabody, Mass.) – A new Applications Notebook from JEOL features over 20 application notes describing the analysis of synthetic polymers, small organic molecules, complex drug mixtures, peptides, and proteins using the JEOL SpiralTOFTM MALDI TOF-TOF mass spectrometer. The SpiralTOF time-of-flight optics design utilizes a figure-eight ion trajectory to allow a 17m flight... Read more
July 10, 2012 (Semicon West, San Francisco, CA) — Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes... Read more