JEOL Introduces New Best-in-Class Field Emission SEM
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com September 1, 2015, Peabody, MA — JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon. The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at... Read more