New MFP-3D Infinity AFM Photovoltaic Option Offers a Turnkey Solution for Characterizing Photoconductive Materials
21 October 2017 Over the past decade, atomic force microscopes (AFMs) have been instrumental in understanding the nanoscale morphology of photovoltaic (PV) materials, an essential step to improving their performance. However, characterising the photoresponse of these materials with the AFM has often required a great deal of custom instrumentation development on the researcher’s part.... Read more