Announcing the New Jupiter XR Large-Sample AFM from Asylum Research
Feb 27, 2019 Oxford Instruments Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM), the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in... Read more