August 20, 2015 Microscopy

JEOL Brasil Sponsors LNNano Transmission Electron Microscopy Summer School

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com August 20, 2015 (Peabody, MA and Sao Paulo, Brazil) — JEOL BRASIL Instrumentos Científicos Ltda. is proud to sponsor the 6th biannual Transmission Electron Microscopy (TEM) Summer School being held at the Brazilian Nanotechnology National Laboratory (LNNano), located in the Brazilian Center for Research in... Read more

June 16, 2015 Microscopy PR/Corporate

Pollen Prevails as JEOL Names Spring Image Contest Winners

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com June 15, 2015, Peabody, MA — Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row. April’s winning image of hibiscus... Read more

May 7, 2015 Industrial Microscopy Product Launch

New JEOL E-Beam Lithography System to Enhance Quantum NanoFab Capabilities

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com May 5, 2015 – Peabody, MA — A state-of-the-art JEOL e-beam lithography system will soon be a new resource for quantum information science researchers that utilize the cutting-edge facilities at the University of Waterloo Quantum NanoFab in Waterloo, Ontario. The JEOL JBX-6300FS e-beam system will... Read more

March 9, 2015 Environ, Ag./Food & Bev Mass Spectrometry PR/Corporate

JEOL Celebrates 10 year anniversary of Direct Analysis in Real Time and Introduces New AccuTOF-DART 4G

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 9, 2015 (Pittcon, New Orleans) — JEOL is proud to celebrate the 10th anniversary of the introduction of the enormously popular AccuTOF-DART® ambient ionization mass spectrometer by introducing the new AccuTOF-DART®4G at Pittcon 2015, with new performance capabilities including enhanced resolution, speed, and accuracy in... Read more

March 9, 2015 Chromatography Industrial Informatics & Software Mass Spectrometry Product Launch

JEOL Unveils 4th Generation GCxGC Mass Spectrometer with Powerful Data Analysis Software at Pittcon 2015

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 9, 2015 Peabody, MA — The JEOL AccuTOF-GCx will be exhibited for the first time in the U.S. at Pittcon 2015 in New Orleans, booth #1523. The AccuTOF-GCx, the fourth generation of JEOL’s successful gas chromatography/time-of-flight mass spectrometer systems, is designed for optimum throughput,... Read more

January 13, 2015 Atomic Spectroscopy Industrial M&A, Partnerships Microscopy Product Launch

JEOL and UC Irvine Partner to Develop Premier Electron Microscopy and Materials Research Center

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (January 13, 2015 — Peabody, Mass.) JEOL USA and the University of California’s Irvine Materials Research Institute (IMRI) have entered into a strategic partnership to create a premier electron microscopy and materials science research facility. The IMRI will serve as an interdisciplinary nexus for the... Read more

October 7, 2014 Atomic Spectroscopy Industrial Product Launch

JEOL Announces New EDXRF for Wide Range of Sample Types

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com October 7, 2014 (Peabody, MA) — JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types – solids, powders, and liquids – with little or no... Read more

August 20, 2014 Molecular Spectroscopy PR/Corporate Product Launch

New NMR Spectrometer Series Announced by JEOL Ltd.

JEOL Ltd. (President Gon-emon Kurihara) and JEOL RESONANCE, Inc. (President Takahiro Anai) is pleased to announce a new line of NMR spectrometers, JNM-ECZS series. The JNM-ECZS series is a next generation NMR spectrometer that incorporates ultra-high accuracy RF circuitry utilizing the latest digital high frequency technology. The compact spectrometer design features unprecedented levels of performance... Read more

March 28, 2014 Product Launch

New JEOL-Nikon MiXcroscopy Correlative Imaging Solution

March 27, 2014 (Peabody, MA) — JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the... Read more