March 7, 2016 Mass Spectrometry Product Launch

Big Picture Plus Analysis from a Small, Compact, and Versatile Benchtop SEM – The JSM-6000PLUS NeoScope from JEOL

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, Georgia) — JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers... Read more

March 7, 2016 Microscopy PR/Corporate Product Launch

JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016 Atlanta, GA) — JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A... Read more

February 23, 2016 Microscopy

Researchers first to prove ZIKA Virus associated with Microcephaly Used JEOL Transmission Electron Microscopes (TEM) for imaging brain sections

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com Scientists from the Institute of Microbiology and Immunology and the Institute of Pathology in Ljubljana, Slovenia are the first in the world to publish and prove that the ZIKA virus is associated with Microcephaly (New England Journal of Medicine, February 10, 2016). ZIKV was found... Read more

February 3, 2016 Microscopy Product Launch

New JEOL “F2” Versatile S/TEM Offers Advanced Analytical Features

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (February 3, 2016 — Peabody, MA) — JEOL’s most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or “F2,” the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon... Read more

January 15, 2016 Microscopy

JEOL USA Announces Grand Prize winners for 2015 SEM & TEM Image Contest

(January 14, 2016 — Peabody, MA) — JEOL USA selected two Grand Prize winners from a large collection of customer images submitted to the 2015 Image Contest throughout the calendar year. While one image was selected to win each month, the Grand Prize images exhibited the very best composition and resolution, and demonstrated excellent technical... Read more

January 15, 2016 Microscopy PR/Corporate

JEOL USA Announces Grand Prize winners for 2015 SEM & TEM Image Contest

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (January 14, 2016 — Peabody, MA) — JEOL USA selected two Grand Prize winners from a large collection of customer images submitted to the 2015 Image Contest throughout the calendar year. While one image was selected to win each month, the Grand Prize images exhibited... Read more

November 4, 2015 Microscopy Product Launch

NEW Versatile High Throughput SEM from JEOL

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com Portland, OR – November 4, 2015 — JEOL’s new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.... Read more

October 6, 2015 Microscopy Product Launch

Get the big picture from a small, compact, and versatile Benchtop SEM

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com Introducing the JCM-6000PLUS NeoScope from JEOL JEOL USA, Peabody, MA (October 6, 2015) — JEOL’s benchtop SEM makes it possible to bring basic high resolution imaging and analysis features of a full-sized Scanning Electron Microscope into the lab. It fits into both small spaces and... Read more

September 3, 2015 Microscopy Product Launch

JEOL Introduces New Best-in-Class Field Emission SEM

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com September 1, 2015, Peabody, MA — JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon. The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at... Read more