JEOL RESONANCE and Mestrelab Research S.L., announce technology partnership for qNMR market – qNMR seamless

| | JEOL RESONANCE and Mestrelab Research S.L., announce technology partnership for qNMR market – qNMR seamless posted on April 27, 2017 fully automated signal acquisition and qNMR analysis capability ( read this press release… ) New Field Emission Cryo-Electron Microscope JEM-Z200FSC posted on April 27, 2017 automatically acquires image data for Single Particle Analysis... Read more

JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron... Read more

New FilterSpray™ Ionization Module Expands Analytical Capabilities of AccuTOFTM-DART®, the “Ambient Ionization Toolbox” Mass Spectrometer

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (March 1, 2017 Peabody, Mass.) — A new FilterSpray™ module developed for the AccuTOF-DART Mass Spectrometer makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization. The optional module is a simple alternative to Electrospray Ionization that eliminates the... Read more

New JEOL NMR Probe for Fluorinated Compounds

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (March 1, 2017, Peabody, MA) — With the introduction of the ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy, JEOL offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in many new pharmaceutical products.  The ROYAL HFX is the world’s... Read more

JEOL Highlights New Analytical Technologies at ASMS 2016

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com June 2, 2016 (Peabody, Mass.) — JEOL USA will unveil several new analytical technologies during ASMS 2016 in San Antonio, Texas (Booth #229). With a comprehensive line of time-of-flight mass spectrometers, JEOL advances analytical capabilities for a wide range of scientific research. JEOL and the... Read more

JEOL Founders Recognized with Pittcon Heritage Award

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 24, 2016 Peabody, MA — JEOL is honored to announce that the company founders were recognized for their scientific vision and pioneering leadership at Pittcon 2016 in Atlanta, Georgia. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt, presented the Pittcon Heritage Award... Read more

JEOL Demonstrates New Analytical Technology at Pittcon 2016

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta GA) — JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in... Read more

JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, GA) — At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the... Read more

New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. The new EI/PI source complements the dedicated electron ionization (EI), positive/negative chemical ionization (CI), field desorption/field ionization (FD/FI) and combination... Read more

Powerful Problem-solving Mass Spectrometer Demonstrations at Pittcon 2016 – JEOL AccuTOF-DART 4G

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, GA) — At Pittcon 2016 (Booth #2857) JEOL will demonstrate the latest features of the game-changing open air ambient ionization mass spectrometer system. This third-generation AccuTOFTM-DART® 4G couples the facile operation of the DART (Direct Analysis in Real Time)... Read more