April 18, 2018 Atomic Spectroscopy

Grand Opening of UC Irvine Materials Research Institute (IMRI) to Spotlight JEOL Center for Nanoscale Solutions

GRAND ARM Transmission Electron Microscope – JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI) Renowned Materials Scientists to Present at the 1st International Symposium on Advanced Microscopy and Spectroscopy (ISAMS) April 18, 2018 – Peabody, Mass. —- World-renowned electron microscopists will join Dr. Xiaoqing Pan, Director of the University of California Irvine... Read more

February 9, 2018 Uncategorized

SCMI Consortium chooses JEOL JEM-Z300FSC CRYO ARM™ 300

The Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI). Further information: JEOL UK press release Also See: CRYO ARM™ 200 Field Emission Cryo-electron MicroscopeCRYO ARM™ 300 Field Emission Cryo-electron Microscope # # # JEOL USA,... Read more

November 15, 2017 Uncategorized

JEOL’s Food Drive for Haven for Hunger Gets Competitive

Six teams with captains wearing hand decorated chefs hats were able to collect 6,111 pounds of food to donate from JEOL to the local food pantry.) November 15, 2017 – Peabody, Mass. —- The spirit of giving is getting competitive at JEOL USA headquarters in Peabody, Mass. JEOL employees were challenged to a food drive... Read more

August 30, 2017 M&A, Partnerships Microscopy

Establishment of JEOL-Nikon CLEM Solution Center

August 30, 2017 Nikon Corporation is pleased to announce the “JEOL-Nikon CLEM Solution Center”, a collaborative project between Nikon and JEOL Ltd., will be established on September 1, 2017. The center will be opened in the R & D Building of JEOL to provide experience in and collect and deliver technical information on cutting-edge CLEM*... Read more

August 7, 2017 Microscopy Product Launch

JEOL Introduces new IT500HR High Resolution SEM on opening day at M&M 2017

For further information, please visit https://www.jeol.co.jp/en/products/detail/JSM-IT500HR.html. # # # JEOL USA, Inc. JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection... Read more

June 15, 2017 Acad, Gov/Utilities Industrial Mass Spectrometry

Unique Mass Spectrometer for Analysis of Semiconductor Process Gases

June 15, 2017, Peabody, Mass. — The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more.  No larger than a desktop PC, the InfiTOF instantly separates isobaric gases such CO and N2, or N2O and CO2, for... Read more

June 1, 2017 Microscopy Product Launch

JEOL Announces New Field Emission Scanning Electron Microscope

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (June 1, 2017 – Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis.  This tool excels in lightning fast data acquisition through simple and... Read more

May 16, 2017 Uncategorized

JEOL Introduces World's Fastest Direct Write E-Beam Tool

May 16, 2017 (Peabody, Mass.) — Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write system, the JBX-8100FS. This new generation of e-beam introduces the capability of... Read more

May 16, 2017 Microscopy Product Launch

JEOL Introduces World’s Fastest Direct Write E-Beam Tool

FOR IMMEDIATE RELEASE CONTACT: Patricia Corkum, Marketing Manager 978-536-2273 • pcorkum@jeol.com • www.jeolusa.com May 16, 2017 (Peabody, Mass.) — Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write... Read more

May 11, 2017 Microscopy Product Launch

New JEOL JSM-IT300HR InTouchScope™ SEM

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com Ultrahigh resolution imaging of large samples in their native state May 11, 2017 — Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new... Read more