January 22, 2021 – JEOL Ltd. (President & COO Izumi Oi) announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of “Quick and easy to operate and get high-contrast and high-resolution... Read more
January 7, 2021, Peabody, Mass. – JEOL USA awarded two Grand Prizes to winners of its 2020 Electron Microscopy Image Contest, and kicked off its 2021 Image Contest at the beginning of the new year. The annual contest showcases JEOL microscope users’ artistically or esthetically pleasing images with good composition, sharp focus, and technical competency,... Read more
August 3, 2020, Peabody, Mass. JEOL expands its revolutionary FE SEM product group with the introduction of a compact, versatile Field Emission SEM that offers ultrahigh resolution and versatile analytical capabilities at a great value. The new JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both High and Low Vacuum modes... Read more
July 1, 2020 Peabody, Mass. – The launch of a new JEOL Field Emission Scanning Electron Microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM. JEOL’s new JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and... Read more
✓ Rigaku and JEOL will unify their core technologies—Rigaku’s high-speed, high-sensitivity photon-counting detector (HPC) and state-of-the-art single crystal software, and JEOL’s transmission electron microscope—to create an integrated MicroED platform providing one-step structure solutions with electron crystallography. ✓ The resulting MicroED platform, based on the synergistic collaboration of both companies, will provide a solution for the... Read more
May 21, 2020 (Peabody, MA) – JEOL USA announces that it has been awarded a major contract by the US Department of Homeland Security Customs and Border Protection for five JEOL AccuTOF-DART Direct Analysis in Real Time, Time-of-Flight Mass Spectrometers. These instruments will enhance the analytical capabilities of five US Customs and Border Protection laboratories... Read more
A joint paper was published with the RIKEN-JEOL Collaboration Center, Institute for Integrated Cell-Material Sciences (WPI-iCeMS), University of Warwick, and JEOL RESONANCE Inc. This article has also been featured on the cover! Highlights: Selective detection of 1H signals of API in a tablet formulation is proposed. 1H signals of excipients are suppressed. 1H signals in the vicinity of... Read more
2 March 2020, PEABODY, MA: JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to highlight its latest key strategic partnerships at Pittcon 2020: Mass-Spectrometry: NETZSCH integrated Thermal Analysis GC/MS system Electron Microscopy: Acquisition of Integrated Dynamic Electron Solutions, Inc. NMR Spectroscopy: RIKEN-JEOL Collaboration Center and the Kyoto... Read more
2 March 2020, PEABODY, MA: JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020. JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry,... Read more
January 23, 2019 – Peabody, Mass. JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly... Read more