Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images... Read more
Peabody, Mass., December 7, 2005 – The USA subsidiary of JEOL Ltd., an international supplier of electron microscopes and analytical instruments, has entered into a partnership agreement with Massachusetts Institute of Technology’s Institute for Soldier Nanotechnologies (ISN). The mission of the ISN, a research collaboration between the United States Army and MIT, is to develop... Read more
Peabody, Mass., September 30, 2005 – The JEOL DART™, an ion source for the JEOL AccuTOF™ mass spectrometer, has been selected by R&D Magazine and an independent judging panel as one of the 100 most technologically significant products introduced into the marketplace in 2005. The DART, an acronym for Direct Analysis in Real Time, was... Read more
Peabody, Mass., September 30, 2005 – JEOL, the industry-leading manufacturer of Transmission Electron Microscopes (TEMs), has developed a new capability known as Sirius which allows remote operation and imaging using the JEOL TEM. “Now you can see atoms from six thousand miles away,” says Dr. Mike Kersker, JEOL USA Vice President and Product Manager. “You... Read more
Peabody, Mass., June 16, 2005 – JEOL will present a suite of solutions for critical analysis of wafer defects and nanometric designs at Semicon West 2005. From precision sample preparation to ultrahigh resolution imaging at the nanoscale, JEOL semiconductor tools are designed for today’s most advanced processes. Cross Section Polisher Sample Preparation On display in... Read more