November 28, 2006 (Peabody, Mass.) — JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process. This is the second U.S. patent... Read more
November 9, 2006 (Peabody, Mass.) — JEOL USA introduces the latest in imaging technology and microscopy automation with its new 120 kV high resolution Transmission Electron Microscope (TEM). This versatile instrument, the model JEM-1400, is optimized for biological, polymer, and materials research, combining both imaging and cryomicroscopy excellence. High contrast resolution is assured at 0.38nm... Read more
November 9, 2006 (Peabody, Mass.) — JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be... Read more
Peabody, Mass., July 25, 2006 — JEOL USA, the industry-leading supplier of electron microscopes, has installed a model JEM-2100 LaB6 Transmission Electron Microscope (TEM) at Oklahoma State University’s new microscopy service laboratory. The lab, which will serve researchers from both the university and neighboring industry, hosted an open house to introduce their expanded facilities and... Read more
Peabody, Mass., June 26, 2006 — JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron... Read more
June 2006, Peabody, MA — For the sixth consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. Through quarterly surveys of more than 150 JEOL customers,... Read more
Peabody, Mass., May 19, 2006 — JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of... Read more
Peabody, Mass., May 17, 2006 — JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in... Read more
Peabody, Mass., April 7, 2006 – JEOL USA, a leading supplier of electron microscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President. Mr. Genovese has held successive management positions in the sales organization since joining JEOL in 1983. He manages... Read more
Peabody, Mass., February 14, 2006 – Live demos of a new low vacuum, high resolution SEM, direct analysis in real time mass spectrometer (AccuTOF-DART™), and remote operation of ECA/ECX NMR spectroscopy systems will be ongoing in the JEOL booth, #2132 and 2133 at the Orange County Convention Center West Building, Orlando, Florida. SEM Technology Throughout... Read more