July 9, 2007 Microscopy

In-situ JEOL TEM Reveals Distinctive Information at DOE Lawrence Berkeley National Lab

A team of researchers from the Department of Energy’s Lawrence Berkeley National Laboratory, Purdue University and Hysitron Inc. in Minneapolis are using special instrumentation with the JEOL 3010 in situ transmission electron microscope to correlate high-resolution load-displacement measurements with individual video frames, showing how nanoscale volumes of aluminum deform under stress from a diamond “nanoindenter”.... Read more

May 9, 2007 PR/Corporate

JEOL USA Receives Seventh Consecutive Omega Award for Service

May 8, 2007 (Peabody, Mass.) — For the seventh consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega NorthFace Scoreboard Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. “We at JEOL are proud of our... Read more

May 4, 2007 Uncategorized

York-JEOL Nanocentre Opens in U.K.

The University of York has taken a significant step into new fields of sub-Angstrom level materials research with the opening of the York JEOL Nanocentre. The interdisciplinary research and teaching centre represents a £5.5 million investment in novel nanoscience capability by the University of York, regional development agency, Yorkshire Forward, the European Union, and by... Read more

April 26, 2007 Liq. Handling & Robotics

Harvard to Collaborate with JEOL on High Resolution, 3D Brain Imaging

April 26, 2007 (Peabody, Mass.) — JEOL USA announced today that researchers at Harvard University’s Department of Molecular and Cellular Biology have selected JEOL as a partner in a collaborative effort to map the brain using high resolution SEM images. Harvard biologist Professor Jeff Lichtman, post-doctorate Narayanan (Bobby) Kasthuri, and University of Southern California Research... Read more

April 10, 2007 Acad, Gov/Utilities M&A, Partnerships Microscopy

Indiana University Selects JEOL 300kV TEM for Virus and Nanotechnology Studies

April 10, 2007, Peabody, Mass. — The acquisition of a new 300 kV field emission Transmission Electron Microscope (TEM) from JEOL distinguishes Indiana University, Bloomington, Indiana as a major United States research facility where scientists can examine both biological and materials science structures at nanoscale resolution. Acquisition of the new JEOL TEM was completed in... Read more

March 28, 2007 Licensing, IP, and Legal

JEOL Technics Ships 10,000th Unit

March 28th, 2007, Peabody, Mass. — JEOL USA, a leading supplier of scientific instruments in the Americas, is proud to announce that JEOL Technics, one of the company’s design and manufacturing branches in Akashima, Japan, has shipped its 10,000th Scanning Electron Microscope (SEM). Since JEOL, Ltd. was founded in 1949, more than 6,000 JEOL instruments... Read more

March 15, 2007 Microscopy Product Launch

New JEOL FE Analytical SEM for HV and LV Operation

March 12, 2007, Peabody, MA — A new thermal field emission analytical SEM from JEOL, the JSM-7001F, acquires high resolution micrographs at up to 1,000,000X for applications ranging from semiconductor, metals, minerals, materials, and ceramics, to non-conductive biological samples. The JSM-7001F features a unique in lens field emission gun that delivers more than 200 nA of... Read more

February 14, 2007 Product Launch

New Failure Analysis Tool from JEOL

February 13, 2007, Peabody, MA – The high spatial resolution and flexibility of the JEOL Beam Tracer allows this new failure analysis tool to precisely locate and mark defect sites in multi-layer semiconductor devices. The Beam Tracer images marginal and failed interconnects and junctions through several complex layers. It allows measurement of individual transistors, performs... Read more

January 16, 2007 Uncategorized

JEOL USA Exhibiting Imaging Solutions at APEX 2007

January 16, 2007, Peabody, MA — For the first time in its 50+ year history, JEOL USA will be exhibiting at the IPC Printed Circuits Expo/APEX (February 18-22, 2007, Los Angeles, CA). JEOL USA will showcase an argon ion beam cross section polisher (CP) for specimen preparation prior to high magnification imaging with the scanning... Read more