July 30, 2008 (Peabody, Mass.) — From the exhibition hall at the 2008 Microscopy and Microanalysis Conference in Albuquerque, New Mexico, JEOL USA will demonstrate – via remote operation – three of its more than 30 JEOL TEMs currently using Sirius™ Remote TEM software and internet or wireless connections. Visitors to the booth will be... Read more
July 31, 2008 (Peabody, Mass.) — JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens... Read more
July 30, 2008 (Peabody, Mass.) — JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research... Read more
July 28, 2008 (Peabody, Mass.) — JEOL USA will host a tutorial session at M&M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce PRISM – Practical Remote In Situ Microscopy. The PRISM tutorial will be held on Monday, August 4, 2008 at the Microscopy & Microanalysis (M&M) Exhibit in Albuquerque,... Read more
July 28, 2008 (Peabody, MA) — JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring... Read more
See the new JEOL lineup: Power Tools for Microscopy and Sample Processing https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/86/JEOL-Debuts-New-Products-at-MM-2008 Read more
May 13, 2008 (Peabody, Mass.) — JEOL USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry. The AccuTOF-DART Applications Notebook 4th edition is updated to include several new applications notes covering topics as diverse as real-time analysis of deoxynivalenol in beer to GC/MS using the DART™... Read more
March 3, 2008 (Pittcon 2008, New Orleans, LA) — Two of the world’s leading imaging equipment suppliers – Nikon Instruments and JEOL – have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. “The NeoScope partnership... Read more
January 15, 2007 (Peabody, Mass.) — JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first... Read more
January 7, 2008 (Peabody, Mass.) — JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the... Read more