February 8, 2010, Peabody, Mass. — The installation of an advanced imaging tool, a JEOL Electron Probe Microanalyzer (EPMA), will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina. In January, JEOL completed the installation of its new generation of EPMA, also known as a microprobe, at the Southeastern North... Read more
January 21, 2010, Peabody, Mass. — JEOL’s award-winning AccuTOF-DART™ mass spectrometer, featuring the new iPod touch-enabled DART SVP ion source, offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology. JEOL introduced the Direct Analysis in Real Time (DART™) ion source in 2005 for its AccuTOF-LC mass... Read more
December 16, 2009 (Peabody, Mass.) — The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an... Read more
December 1, 2009, Peabody, Massachusetts, USA – JEOL, globally-recognized for its advanced Electron Microscopes, Spectrometers, and E-Beam Lithography tools, announces the appointment of a new JEOL Canada Sales Manager. Richard Humphrey of Calgary, Alberta, will represent JEOL throughout all Canadian provinces with the exception of Quebec and Eastern Ontario, which will continue to be represented... Read more
October 21, 2009, Peabody, Mass. — JEOL, a global leader in the development and manufacture of scanning and transmission electron microscopes, introduces ClairScope™, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM). The new JEOL ClairScope enables uncompromised observation of samples in their... Read more
With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new... Read more
August 11, 2009 (Peabody, Mass.) — JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis. These two new books can be downloaded from the JEOL... Read more
June 30, 2009 (Peabody, Mass.) — JEOL, a leading supplier of electron microscopes for ultrahigh resolution imaging and analysis, will demonstrate its new ultrahigh resolution, analytical Thermal Field Emission Scanning Electron Microscope (SEM), the JSM-7600F, via live remote viewing and control from Semicon West, San Francisco, July 14-16. The SEM will be remotely operated from... Read more
Peabody, Mass., April 30, 2009 — JEOL USA, the leading supplier of electron microscopes and scientific instrumentation to research labs, industry, health and investigative organizations throughout North and South America, announced the promotion of Peter Genovese to the position of President. Mr. Genovese, a member of the JEOL sales organization for more than 25 years,... Read more
April 28, 2009 (Peabody, MA) — For now, scientists at Florida State University (FSU) can only envision what some misoriented atoms are up to along the defects of the new materials that they are developing. They’ll finally be able to clearly see each individual atom and how it relates to its neighbors when they take... Read more