August 25, 2010 (Peabody, Mass.) — JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging... Read more
August 18, 2010 (Peabody, Mass.) — The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10... Read more
August 18, 2010 (Peabody, Mass.) — Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of... Read more
July 20, 2010 (Peabody, Mass.) — JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its... Read more
July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M)... Read more
May 21, 2010 (Peabody, Mass.) — JEOL USA announced today the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of... Read more
April 6, 2010, Peabody, Mass. — The imaging performance of today’s generation of Transmission Electron Microscopes (TEMs) is improved dramatically through the use of a novel technique, the thin film phase plate. JEOL is the only electron microscope supplier to offer commercially-available thin film phase plate technology to its Life Sciences customers, in particular those... Read more
Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima, who pioneered the use of high resolution transmission electron microscopy (HRTEM) to characterize nanomaterials in the early 70s and successfully imaged carbon nanotubes in the early 90s. Although he has used JEOL TEMs for the past four decades, Dr. Iijima visited JEOL... Read more
March 18, 2010, Peabody, Mass. — JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the... Read more
February 18, 2010 (Peabody, Mass.) — The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information... Read more