July 26, 2012 (Peabody, Mass.) – A new Applications Notebook from JEOL features over 20 application notes describing the analysis of synthetic polymers, small organic molecules, complex drug mixtures, peptides, and proteins using the JEOL SpiralTOFTM MALDI TOF-TOF mass spectrometer. The SpiralTOF time-of-flight optics design utilizes a figure-eight ion trajectory to allow a 17m flight... Read more
July 10, 2012 (Semicon West, San Francisco, CA) — Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes... Read more
May 31, 2012 (Peabody, Mass.) — JEOL’s new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution JSM-7800F. The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for nanotechnology imaging and analysis. JEOL’s highest performance FE-SEM makes it... Read more
April 17, 2012 (Peabody, Mass.) — JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a... Read more
110kHz Magic Angle Spinning, a record for spinning speed with JEOL Resonance’s new 0.75 mm Solid State NMR Probe April 11, 2012 (Miami, Florida) — JEOL Resonance, Inc., headquartered in Akishima, Tokyo, will announce a new 0.75 mm solid state NMR probe at the 53rd Experimental Nuclear Magnetic Resonance Conference that opens on April 15,... Read more
November 10, 2011 (Peabody, Mass.) JEOL USA, a leading supplier of scientific instruments in the Americas, was honored by a visit from the Consul General of Japan in Boston, Mr. Takeshi Hikihara, on Wednesday, November 9, 2011. As a representative of the Foreign Ministry, Mr. Hikihara serves Japanese communities and businesses throughout New England. JEOL... Read more
October 20, 2011 (Peabody, Mass.) — JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody, has received the prestigious Anachem Award, given by the Association of Analytical Chemistry for his contributions to the development of organic mass spectrometry. The award was presented at the Federation of Analytical Chemical and Spectroscopy Societies (FACSS) meeting in... Read more
October 3, 2011 (Peabody, Mass.) — A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has... Read more
September 27, 2011 (Peabody, MA) — JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody, Massachusetts, has entered an agreement with Arquimed, Ltda. making Arquimed JEOL’s exclusive agent in Chile. Arquimed, located in Santiago, has a 75-year history as one... Read more
July 12, 2011 (Peabody, Mass.) — A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS);... Read more