March 6, Peabody, Mass. — JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL’s SEM and TEM applications teams for their technical and artistic qualities. “Many customers have asked us... Read more
March 3, 2014 (Pittcon, Chicago, IL) — The AccuTOF GCV 4G time-of-flight mass spectrometer that JEOL introduced at last year’s PittCon has received great interest from the mass spectrometry community. JEOL USA, Inc. has received several purchase orders from industrial and academic laboratories, with systems already delivered and installed in the US and Canada. In... Read more
December 10, 2013 (Peabody, Mass.) — JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of biological and materials samples at ultrahigh... Read more
September 4, 2013 (Peabody, MA) — JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL’s popular series of tungsten low vacuum SEMs. This all-new design builds upon... Read more
August 5, 2013 (M&M 2013, Indianapolis, Indiana) — JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8. Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy... Read more
(Peabody, Mass. June 7, 2013) — JEOL USA, Inc. (Peabody, MA) has concluded an OEM agreement with Zoex Corporation (Houston, TX) to offer the Zoex comprehensive two-dimensional gas chromatography (GC x GC) technology with the new JEOL AccuTOF GCV 4G high-resolution time-of-flight mass spectrometer system. “We are very excited about the partnership with Zoex. The... Read more
April 15, 2013 – Pacific Grove, California — JEOL Resonance (Akishima City, Tokyo) has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system will be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC), the largest NMR conference in the... Read more
March 13, 2013 (Peabody, MA) — JEOL’s latest mass spec instrumentation, NMR technology, and analytical scanning electron microscopes (SEM) will be on display at Pittcon 2013 in Philadelphia, PA, March 18-21 in booth 2224. The new AccuTOF GCv 4G mass spectrometer, the NeoScope Benchtop Scanning Electron Microscope (SEM) and the InTouchScope SEM will be in... Read more
October 25, 2012 (Peabody, MA) — A new application note from JEOL demonstrates that high mass resolving power can be maintained for matrix-assisted laser desorption ionization (MALDI) imaging of biological specimens by using a TOF system with a very long flight path. The JEOL SpiralTOF MALDI TOF/TOF mass spectrometer has unique multi-turn ion optics that... Read more
August 3, 2012 (Peabody, Mass.) – JEOL’s newest AccuTOF GCv model – the “4G” – now offers even faster data acquisition rates and higher resolving power than its predecessor. The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a resolving power of 8000. The 50 Hz acquisition rate now makes... Read more