JEOL USA Introduces New Broad Ion Beam Milling, Cross Section Polisher™
January 20, 2025, Peabody, MA. JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP). These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger. These new configurations have an improved... Read more