News about product and service launches
Peabody, Mass., March 9, 2006 — A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation.... Read more
Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images... Read more
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Peabody, Mass., September 30, 2005 – JEOL, the industry-leading manufacturer of Transmission Electron Microscopes (TEMs), has developed a new capability known as Sirius which allows remote operation and imaging using the JEOL TEM. “Now you can see atoms from six thousand miles away,” says Dr. Mike Kersker, JEOL USA Vice President and Product Manager. “You... Read more
Peabody, Mass., July 15, 2005 – JEOL USA, Inc. has developed a unique solution for rapid, automated NMR spectrometer sample exchange. The new ASC24 24-position sample changer allows programmable, random order selection of sample tubes, improving NMR workflow for remote or unattended operation. An Ethernet interface enables plug and play installation, and controls are automatically... Read more