News about product and service launches
November 27, 2007, Peabody, Mass. — JEOL USA introduces a new high throughput SEM/FIB that combines Focused Ion Beam micro milling with the high resolution imaging of the JEOL LaB6 electron column. The MultiBeam is a high-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair. A versatile all-in-one... Read more
November 5, 2007 (Peabody, Mass.) — JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university’s Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL... Read more
October 2, 2007 (Peabody, Mass.) — Get the latest in mass spectrometry applications and news from JEOL USA through its new online newsletter, Mass Media. Launched to meet the needs of the growing JEOL community of mass spec users, the newsletter includes links to newly-published papers by renowned scientists using JEOL mass spectrometers, new applications... Read more
Wesleyan’s Advanced Instrumentation Center has scoped out better way to conduct infinitesimal scientific research. In the past six months, the center has acquired a new, state-of-the art scanning electron microscope (JEOL JSM-6390LV SEM) for 3-D imaging, and a transmission electron microscope (JEOL JEM-1011 TEM) for 2-D sample images. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/83/New-Microscopes-Aid-Wesleyan-Researchers Read more
August 7 , 2007 (Peabody, Mass.) — JEOL USA will introduce and demonstrate a new compact, high-performance, 400MHz NMR spectrometer at ACS Fall 2007, August 20-22, in booth #919-921. The company will unveil the recently announced ECS-400 Nuclear Magnetic Resonance Spectrometer, featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet. The new, fully-digital ECS-400... Read more
A new frontier on the head of a pin: Nanotechnology Institute at University of Alberta, Canada will explore new kinds of matter. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/79/Nanotech-Instruments-from-JEOL-for-New-Canadian-RD-Institute Read more
March 19, 2007, Peabody, Mass. — JEOL USA hosted the spring meeting of the New England Society for Microscopy (NESM) at its Peabody, Massachusetts headquarters on Thursday, March 15. NESM, celebrating its 40th anniversary this year, is a local affiliate of the Microscopy Society of America (MSA). The organization held its first inaugural meeting in 1967... Read more
March 12, 2007, Peabody, MA — A new thermal field emission analytical SEM from JEOL, the JSM-7001F, acquires high resolution micrographs at up to 1,000,000X for applications ranging from semiconductor, metals, minerals, materials, and ceramics, to non-conductive biological samples. The JSM-7001F features a unique in lens field emission gun that delivers more than 200 nA of... Read more
February 13, 2007, Peabody, MA – The high spatial resolution and flexibility of the JEOL Beam Tracer allows this new failure analysis tool to precisely locate and mark defect sites in multi-layer semiconductor devices. The Beam Tracer images marginal and failed interconnects and junctions through several complex layers. It allows measurement of individual transistors, performs... Read more
November 9, 2006 (Peabody, Mass.) — JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be... Read more