July 11, 2008 Licensing, IP, and Legal Microscopy Product Launch

A New FRAP/FRAPa Method for Three-Dimensional Diffusion Measurements Based on Multiphoton Excitation Microscopy

Quantitative measurement method based on FRAP and FRAPa using multiphoton microscopy. We present a new convenient method for quantitative three-dimensionally resolved diffusion measurements based on the photobleaching (FRAP) or photoactivation (FRAPa) of a disk-shaped area by the scanning laser beam of a multiphoton microscope. Contrary to previously reported spot-photobleaching protocols, this method has the advantage... Read more

January 16, 2008 Acad, Gov/Utilities Product Launch

Boston College Integrates Nanofabrication with New JEOL Instruments

January 15, 2007 (Peabody, Mass.) — JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first... Read more

January 9, 2008 Microscopy Product Launch

New “CarryScope” Mobile SEM from JEOL

January 7, 2008 (Peabody, Mass.) — JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the... Read more

November 27, 2007 Microscopy Product Launch

New JEOL MultiBeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging

November 27, 2007, Peabody, Mass. — JEOL USA introduces a new high throughput SEM/FIB that combines Focused Ion Beam micro milling with the high resolution imaging of the JEOL LaB6 electron column. The MultiBeam is a high-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair. A versatile all-in-one... Read more

November 6, 2007 M&A, Partnerships Product Launch

USC Selects JEOL for New Center of Excellence

November 5, 2007 (Peabody, Mass.) — JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university’s Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL... Read more

October 4, 2007 Mass Spectrometry Product Launch

New Mass Spectrometry Newsletter from JEOL USA

October 2, 2007 (Peabody, Mass.) — Get the latest in mass spectrometry applications and news from JEOL USA through its new online newsletter, Mass Media. Launched to meet the needs of the growing JEOL community of mass spec users, the newsletter includes links to newly-published papers by renowned scientists using JEOL mass spectrometers, new applications... Read more

August 16, 2007 Atomic Spectroscopy Microscopy Product Launch

New Microscopes Aid Wesleyan Researchers

Wesleyan’s Advanced Instrumentation Center has scoped out better way to conduct infinitesimal scientific research. In the past six months, the center has acquired a new, state-of-the art scanning electron microscope (JEOL JSM-6390LV SEM) for 3-D imaging, and a transmission electron microscope (JEOL JEM-1011 TEM) for 2-D sample images. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/83/New-Microscopes-Aid-Wesleyan-Researchers Read more

August 7, 2007 Molecular Spectroscopy Product Launch

JEOL Introduces New High-Sensitivity, Compact, Cyber-Enabled NMR Spectrometer

August 7 , 2007 (Peabody, Mass.) — JEOL USA will introduce and demonstrate a new compact, high-performance, 400MHz NMR spectrometer at ACS Fall 2007, August 20-22, in booth #919-921. The company will unveil the recently announced ECS-400 Nuclear Magnetic Resonance Spectrometer, featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet. The new, fully-digital ECS-400... Read more