News about product and service launches
Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope.... Read more
JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science. The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links... Read more
February3, 2009 (Peabody, Mass.) — JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of... Read more
Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central... Read more
July 31, 2008 (Peabody, Mass.) — JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens... Read more
July 30, 2008 (Peabody, Mass.) — JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research... Read more
See the new JEOL lineup: Power Tools for Microscopy and Sample Processing https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/86/JEOL-Debuts-New-Products-at-MM-2008 Read more
Quantitative measurement method based on FRAP and FRAPa using multiphoton microscopy. We present a new convenient method for quantitative three-dimensionally resolved diffusion measurements based on the photobleaching (FRAP) or photoactivation (FRAPa) of a disk-shaped area by the scanning laser beam of a multiphoton microscope. Contrary to previously reported spot-photobleaching protocols, this method has the advantage... Read more
January 15, 2007 (Peabody, Mass.) — JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first... Read more
January 7, 2008 (Peabody, Mass.) — JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the... Read more