New JEOL Atomic Resolution Microscope to Aid Advanced Material Research at Florida State University

April 28, 2009 (Peabody, MA) — For now, scientists at Florida State University (FSU) can only envision what some misoriented atoms are up to along the defects of the new materials that they are developing. They’ll finally be able to clearly see each individual atom and how it relates to its neighbors when they take... Read more

New Standard in Electrophysiology and Deep Tissue Imaging

The function of nerve and muscle cells relies on ionic currents flowing through ion channels. These ion channels play a major role in cell physiology. One way to investigate ion channels is to use patch clamping. This method allows investigation of ion channels in detail and recording of the electric activity of different types of... Read more

JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)

Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope.... Read more

JEOL Produces New Brochure on Instrumentation for Forensic Science

JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science. The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links... Read more

New Versatile Tomography Solution for Life Sciences on JEOL Transmission Electron Microscopes

February3, 2009 (Peabody, Mass.) — JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of... Read more

New David H. Murdock Research Institute Specifies JEOL Cryo-electron Microscopes

Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central... Read more

JEOL Introduces New Thermal FE-SEM at M&M 2008

July 31, 2008 (Peabody, Mass.) — JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens... Read more

JEOL Adds New FE MultiBeam to Its SEM/FIB Lineup

July 30, 2008 (Peabody, Mass.) — JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research... Read more