News about product and service launches
JASCO featured the new High-Throughput Circular Dichroism (CD) Measurement System during Pittcon 2012, Orlando, Florida. The JASCO high-throughput CD measurement (HDX-CD) system automates CD and UV/Visible Absorbance measurements for large numbers of samples. A third detection option also allows simultaneous Fluorescence measurement of the samples. An innovative flow system coupled with the ASU-800 autosampler offers... Read more
April 17, 2012 (Peabody, Mass.) — JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a... Read more
The need for data validation and accessibility has never been greater than it is today. We are inundated with information from a multitude of resources, but how can we easily evaluate the accuracy of that data? In the past, the peer review process provided this and was often run by publishers. Read more
October 3, 2011 (Peabody, Mass.) — A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has... Read more
July 12, 2011 (Peabody, Mass.) — A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS);... Read more
July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more
June 30, 2011 (Peabody, MA) — Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain... Read more
May 31, 2011 (Peabody, MA) — JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification... Read more
JASCO featured the New! FP-8000 series of spectrofluorometers during Pittcon 2011. Building upon the powerful capabilities of the FP-6000 series, the FP-8000 series instruments provide even greater features and technological innovations. The JASCO FP-8000 Series spectrofluorometers incorporate the highest sensitivity, fastest spectral scanning capability and excellent analysis-oriented functionality offering integrated solutions for advanced materials research... Read more
April 6, 2011 (Peabody, Mass.) — Effective April 1, 2011, JEOL, Ltd., (Akishima, Japan), a global leader in the design and manufacture of scientific instrumentation, and the Innovation Network Corporation of Japan (INCJ) have formed a new joint venture company dedicated to the development of next-generation NMR instrumentation. The new spinoff, JEOL Resonance, Inc., will... Read more