August 2, 2013 Microscopy Product Launch

New Labeling Tools Can Help to Realize the Full Potential of Super-Resolution Microscopy

Since super-resolution microscopy techniques revolutionized the concept of light microscopy by overcoming the physical diffraction limit, STED microscopy and other super-resolution techniques have aroused considerable interest. The diffraction limit imposes no more constraints on resolution. New microscopes with ever-decreasing resolution limits are being developed, for instance by the inventor of STED microscopy, Prof. Stefan Hell,... Read more

June 9, 2013 Product Launch

Introducing The J-1000 Series Circular Dichroism Spectrometers

JASCO continues to revolutionize the characterization of biomolecules NEW! J-1000 Series Circular Dichroism Spectrometers JASCO is pleased to announce the new J-1000 Series CD Spectrometers offering unparalleled sensitivity, with reach from the vacuum UV to the NIR wavelengths. Also, introducing Simultaneous Multi-Probe Spectroscopy (SMP) which consists of three modes (CD, LD and Absorbance) running concurrently... Read more

April 17, 2013 Acad, Gov/Utilities Microscopy Molecular Spectroscopy Product Launch

JEOL Resonance Introduces New Zero Boil Off Magnet for NMR Systems

April 15, 2013 – Pacific Grove, California — JEOL Resonance (Akishima City, Tokyo) has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system will be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC), the largest NMR conference in the... Read more

December 10, 2012 Product Launch

GE Analytical Instruments Launches Cleaning Validation Re-Imagined Initiative

December 10, 2012 – Boulder, CO – GE Analytical Instruments announces its new Cleaning Validation Re-Imagined initiative that encourages life science companies to re-think how they look at cleaning validation (CV). For years, these industries have viewed methods to detect residues from the cleaning process as product-specific. However, GE Analytical Instruments is simplifying how companies implement... Read more

July 27, 2012 Mass Spectrometry Product Launch

New SpiralTOF™ MALDI TOF Applications Notebook Available from JEOL

July 26, 2012 (Peabody, Mass.) – A new Applications Notebook from JEOL features over 20 application notes describing the analysis of synthetic polymers, small organic molecules, complex drug mixtures, peptides, and proteins using the JEOL SpiralTOFTM MALDI TOF-TOF mass spectrometer. The SpiralTOF time-of-flight optics design utilizes a figure-eight ion trajectory to allow a 17m flight... Read more

July 10, 2012 Microscopy Product Launch

JEOL Puts a New Spin on its Benchtop SEM – NeoScope

July 10, 2012 (Semicon West, San Francisco, CA) — Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes... Read more

June 19, 2012 Product Launch

New Video – Sievers Certified Reference Materials (TOC Standards) and Certified TOC Vials

June 19, 2012 – Boulder, CO – GE Analytical Instruments has just launched a new 3-minute video about its Sievers Certified Reference Materials (Total Organic Carbon, or TOC, Standards) and Certified <10 ppb TOC sample vials. This video shows how GE Analytical Instruments produces its Sievers Certified Reference Materials and Certified TOC Vials using the highest... Read more

May 7, 2012 Product Launch

GE Analytical Instruments Launches French Web Site

May 7, 2012 – Boulder, CO – GE Analytical Instruments is pleased to announce its new French web site, located at www.fr.geinstruments.com.  The site includes new and expanded content, full French navigation, quick links to all French documents, and more.  To search for web pages and documents in all languages, visit the Library at the English... Read more

May 1, 2012 Acad, Gov/Utilities Product Launch

New Smart Leakwise Controller for Oil Leak Monitoring

May 1, 2012 – Boulder, CO – GE Analytical Instruments is pleased to announce the new Smart Leakwise Controller (SLC-220), a digital signal processor that interfaces with Leakwise ID-220 Oil-on-Water Monitoring Sensors to report hydrocarbons spill/leak alerts, including layer buildup and thickness. The SLC-220 enables communications via a wide variety of outputs and communication interfaces for... Read more

April 24, 2012 Molecular Spectroscopy Product Launch

New! UV-Vis/NIR Microscopic Spectrophotometer, MSV-5000 Series

JASCO introduced the MSV-5300 UV-Vis/NIR Microscope, one microscope system of the MSV-5000 series, during Pittcon 2012, Orlando, Florida. This microscope system incorporates a double-beam scanning spectrophotometer for optimum measurements in the UV-Vis to NIR region (200-2700 nm). The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of... Read more