News about product and service launches
October 3, 2011 (Peabody, Mass.) — A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has... Read more
July 12, 2011 (Peabody, Mass.) — A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS);... Read more
July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more
June 30, 2011 (Peabody, MA) — Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain... Read more
May 31, 2011 (Peabody, MA) — JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification... Read more
JASCO featured the New! FP-8000 series of spectrofluorometers during Pittcon 2011. Building upon the powerful capabilities of the FP-6000 series, the FP-8000 series instruments provide even greater features and technological innovations. The JASCO FP-8000 Series spectrofluorometers incorporate the highest sensitivity, fastest spectral scanning capability and excellent analysis-oriented functionality offering integrated solutions for advanced materials research... Read more
April 6, 2011 (Peabody, Mass.) — Effective April 1, 2011, JEOL, Ltd., (Akishima, Japan), a global leader in the design and manufacture of scientific instrumentation, and the Innovation Network Corporation of Japan (INCJ) have formed a new joint venture company dedicated to the development of next-generation NMR instrumentation. The new spinoff, JEOL Resonance, Inc., will... Read more
October 25, 2010 (Peabody, Mass.) — JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for... Read more
September 21, 2010 (Peabody, Mass.) — JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic... Read more
August 18, 2010 (Peabody, Mass.) — Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of... Read more