News about product and service launches
July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more
June 30, 2011 (Peabody, MA) — Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain... Read more
May 31, 2011 (Peabody, MA) — JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification... Read more
JASCO featured the New! FP-8000 series of spectrofluorometers during Pittcon 2011. Building upon the powerful capabilities of the FP-6000 series, the FP-8000 series instruments provide even greater features and technological innovations. The JASCO FP-8000 Series spectrofluorometers incorporate the highest sensitivity, fastest spectral scanning capability and excellent analysis-oriented functionality offering integrated solutions for advanced materials research... Read more
April 6, 2011 (Peabody, Mass.) — Effective April 1, 2011, JEOL, Ltd., (Akishima, Japan), a global leader in the design and manufacture of scientific instrumentation, and the Innovation Network Corporation of Japan (INCJ) have formed a new joint venture company dedicated to the development of next-generation NMR instrumentation. The new spinoff, JEOL Resonance, Inc., will... Read more
October 25, 2010 (Peabody, Mass.) — JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for... Read more
September 21, 2010 (Peabody, Mass.) — JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic... Read more
August 18, 2010 (Peabody, Mass.) — Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of... Read more
In pars plana vitrectomy, three ocular incisions are normally made. Thanks to the superb optics and the unique illumination concept of the Leica M844 F40, Dr. Luca Cappuccini from Reggio Emilia Hospital in Italy can operate without one of the incisions for certain vitreoretinal procedures. This shortens the duration of surgery and speeds up eye... Read more
July 20, 2010 (Peabody, Mass.) — JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its... Read more