News about product and service launches
July 10, 2012 (Semicon West, San Francisco, CA) — Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes... Read more
June 19, 2012 – Boulder, CO – GE Analytical Instruments has just launched a new 3-minute video about its Sievers Certified Reference Materials (Total Organic Carbon, or TOC, Standards) and Certified <10 ppb TOC sample vials. This video shows how GE Analytical Instruments produces its Sievers Certified Reference Materials and Certified TOC Vials using the highest... Read more
May 7, 2012 – Boulder, CO – GE Analytical Instruments is pleased to announce its new French web site, located at www.fr.geinstruments.com. The site includes new and expanded content, full French navigation, quick links to all French documents, and more. To search for web pages and documents in all languages, visit the Library at the English... Read more
May 1, 2012 – Boulder, CO – GE Analytical Instruments is pleased to announce the new Smart Leakwise Controller (SLC-220), a digital signal processor that interfaces with Leakwise ID-220 Oil-on-Water Monitoring Sensors to report hydrocarbons spill/leak alerts, including layer buildup and thickness. The SLC-220 enables communications via a wide variety of outputs and communication interfaces for... Read more
JASCO introduced the MSV-5300 UV-Vis/NIR Microscope, one microscope system of the MSV-5000 series, during Pittcon 2012, Orlando, Florida. This microscope system incorporates a double-beam scanning spectrophotometer for optimum measurements in the UV-Vis to NIR region (200-2700 nm). The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of... Read more
JASCO featured the new High-Throughput Circular Dichroism (CD) Measurement System during Pittcon 2012, Orlando, Florida. The JASCO high-throughput CD measurement (HDX-CD) system automates CD and UV/Visible Absorbance measurements for large numbers of samples. A third detection option also allows simultaneous Fluorescence measurement of the samples. An innovative flow system coupled with the ASU-800 autosampler offers... Read more
April 17, 2012 (Peabody, Mass.) — JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a... Read more
The need for data validation and accessibility has never been greater than it is today. We are inundated with information from a multitude of resources, but how can we easily evaluate the accuracy of that data? In the past, the peer review process provided this and was often run by publishers. Read more
October 3, 2011 (Peabody, Mass.) — A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has... Read more
July 12, 2011 (Peabody, Mass.) — A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS);... Read more