News about product and service launches
When Stefan Hell invented a technique that pushed beyond the diffraction limit of light for the first time, a new field of nanoscale imaging was born. Now laboratories around the world are using STED microscopy to smash through more boundaries in fundamental science. Read more
September 4, 2013 (Peabody, MA) — JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL’s popular series of tungsten low vacuum SEMs. This all-new design builds upon... Read more
August 5, 2013 (M&M 2013, Indianapolis, Indiana) — JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8. Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy... Read more
Since super-resolution microscopy techniques revolutionized the concept of light microscopy by overcoming the physical diffraction limit, STED microscopy and other super-resolution techniques have aroused considerable interest. The diffraction limit imposes no more constraints on resolution. New microscopes with ever-decreasing resolution limits are being developed, for instance by the inventor of STED microscopy, Prof. Stefan Hell,... Read more
JASCO continues to revolutionize the characterization of biomolecules NEW! J-1000 Series Circular Dichroism Spectrometers JASCO is pleased to announce the new J-1000 Series CD Spectrometers offering unparalleled sensitivity, with reach from the vacuum UV to the NIR wavelengths. Also, introducing Simultaneous Multi-Probe Spectroscopy (SMP) which consists of three modes (CD, LD and Absorbance) running concurrently... Read more
April 15, 2013 – Pacific Grove, California — JEOL Resonance (Akishima City, Tokyo) has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system will be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC), the largest NMR conference in the... Read more
December 10, 2012 – Boulder, CO – GE Analytical Instruments announces its new Cleaning Validation Re-Imagined initiative that encourages life science companies to re-think how they look at cleaning validation (CV). For years, these industries have viewed methods to detect residues from the cleaning process as product-specific. However, GE Analytical Instruments is simplifying how companies implement... Read more
July 26, 2012 (Peabody, Mass.) – A new Applications Notebook from JEOL features over 20 application notes describing the analysis of synthetic polymers, small organic molecules, complex drug mixtures, peptides, and proteins using the JEOL SpiralTOFTM MALDI TOF-TOF mass spectrometer. The SpiralTOF time-of-flight optics design utilizes a figure-eight ion trajectory to allow a 17m flight... Read more
July 10, 2012 (Semicon West, San Francisco, CA) — Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes... Read more
June 19, 2012 – Boulder, CO – GE Analytical Instruments has just launched a new 3-minute video about its Sievers Certified Reference Materials (Total Organic Carbon, or TOC, Standards) and Certified <10 ppb TOC sample vials. This video shows how GE Analytical Instruments produces its Sievers Certified Reference Materials and Certified TOC Vials using the highest... Read more