JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016 Atlanta, GA) — JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A... Read more