New JEOL “F2” Versatile S/TEM Offers Advanced Analytical Features
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (February 3, 2016 — Peabody, MA) — JEOL’s most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or “F2,” the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon... Read more