Bruker Announces Updated D2 PHASERTM Benchtop X-ray Diffraction (XRD) System with LYNXEYE XE-TTM One-dimensional Detector
BIG SKY, Montana (USA) – July 31st, 2017 – At the 66th annual Denver X-ray Conference, Bruker announces the availability of the LYNXEYE XE-T next generation one-dimensional compound silicon strip detector, further enhancing the performance of its popular D2 PHASERTM benchtop X-ray diffraction (XRD) system. The versatile hardware of the updated D2 PHASER combined with the Bruker DIFFRAC.SUITETM software allows users the flexibility to create... Read more